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Title: Bruker AXS: Home

Description: Bruker AXS designs and manufactures analytical X-ray systems for elemental analysis, materials research and structural investigations. Bruker AXS’ innovative solutions enable a wide range of customers in heavy industry, chemistry, pharmacy, semiconduct

Keywords:XRF, X-ray Spectrometry, XRD, X-ray Diffraction, OES, Optical Emission Spectrometry, Combustion Analysis, Thermal Analysis, X-ray Microanalysis, Biological Crystallography, Chemical Crystallography, Lab Automation, Radionuclide Analysis, On-line XRF, Metallurgy, Conservation, Cement, Raw Materials, Environment Management, Waste Management, Coating, Life Sciences, Mining, Geology, Automotive,

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Nanomaterials, Oils, Pastics, Refinery, RoHS, Semiconductors, EDXRD, EDXRF, WDXRF, EDS, EDX, SAXS, WAXS, Aluminium, Art, Archaeology, Paintings, Building Materials, Cement, Carbon, Coal, Cast Iron, Catalysts, Ceramics, Refractories, Coatings, Glass, Cobalt, Colloids, Compound Semiconductors, Copper, Brass, Epitaxial Layers, Alloys, Ferro Alloys, Fertilizers, Salts, Food, Fodder, Forensic, Fuel, Gasoline, Glass, Chemicals, Inorganic Chemicals, Lead, Lime, Limestone, Clays, Lubricants, Lube Oils, Grease, Magnesium, Metals, Minerals, Rocks, Crystals, Nickel, Ores, Organic Chemicals, Paper, Particles, Pharmaceuticals, Drugs, Pigments, Paints, Polymers, Fibres, Prescious Metals, Proteins, Sand, Quartz, Semiconductors, Si, Si/Ge, Slags, Soils, Sediment, Steel, High Alloys, Low Alloys, Thin films, Tin, Solder, Titanium, Wafers, Waste, Ash, Filters, Dust, Water, Zeolithes, Zinc, µ-Spot Analysis, 3D Structure, Single Crystal, X-ray Structure, Amorphous Mixtures, Crystalline Mixtures, Components, Workpieces, Crystal Growth, Crystalline Powder Analysis, EDS Microanalysis, Elemental Analysis, Nanoanalytics, Phase Transitions, Thin Film Analysis, Layer Thickness, % Crystallinity, Structure Determination, Al-Bath Analysis, Automatic Sample Handling, Sample Handling, Crystal Orientation, Crystalline Phases, Crystalline Structure, Crystallite Size, Electron Density Maps, Elemental Map, High Pressure Structure, High Sample Throughput, Identification, Low Temperature Structure, Monitoring, Nano Particles, Non Ambient Conditions, Polymorph Screening, Preferred Orientation, Texture, Process Control, High Sample Throughput, Trace Elements, Quality Control, Quantitative Analysis, Qualitative Analysis, SAD Phasing, MAD Phasing, Sample Screening, Strain, Stress(View Less)

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