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Google search volume for "spectroscopic"

Website results for "spectroscopic"

 10 websites found



Not available.
#0 (0%) - stan-pts.com
Title: Stanford Photo Thermal Solutions | Tel.: +1 408 898-0446
Description: Stanford Photo-Thermal Solutions is a manufacturer of multifunctional analytical instruments for testing optical coatings, thin films, nonlinear and laser crystals for weak absorption losses, homogeneity, lifetime estimates, etc. Instruments measure abso
Keywords:photothermal, photo-thermal, photo thermal, thermal lensing, photothermal spectroscopy, low absorption, absorption, photorefraction, spectrophotometer, Spectroscopic, Analysis, Spectroscopy, Optical Absorption Tests, Crystal Growing, Absorption Measurements, Nonlinear Crystals, Optical Coatings, PPLN Crystals, KTP Crystals, BBO Crystals, LBO Crystals, Laser Crystals, Coating Quality, Testing, Control,
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#21,613,416 (0%) - sci-sol.com
Title: Scientific Solutions, Inc. Spectroscopic Devices and Consulting. Optical system design.
Description: Scientific Solutions, Inc., Custom Liquid Crystal Fabry-Perot Tunable Filters, High spectral resolutions of 0.002Ang-10nm for optical to NIR, Spectroscopic Devices, Optical System Engineering and Consulting, Laurin Publishing.
Keywords:tunable etalons, tunable, laser tuning, tunible, etalon, etilon, liquid crystal, liquid cristal, Liquid-Crystal, Fabry-Perot, Fabree Pero, Fabre Perot, Fabry Perot, Tunable Filters, tunable filter, Spectroscopy, Spectroscopic Devices, Optical System Design, optical design, optycal, optical sensing, LCFP, liquid crystal tunable filter, liquid crystal Fabry-Perot, Laurin Publishing,
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Not available.
#0 (0%) - axic.com
Title: Axic Inc
Description: AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete Wavelength Ellipsometry, Film Thickness Probe, Reflectometer) for the semiconductor, III-V compound s
Keywords:ellipsometer, ellipsometry, Thin Film Metrology, Thin Film Measurement, Thickness Measurement, Spectroscopic Ellipsometry, Spectroscopic Ellipsometer, Reflectometer, Thin Film Analysis, refractive index, optical measurement, Plasma etch, Plasma etcher, Reactive ion etch, Reactive ion etcher, Plasma deposition, PECVD, Plasma enhanced chemical vapor deposition, ICP etch, ICP etcher, Inductively coupled plasma etcher, ICP PECVD, Photoresist stripping, Photoresist stripper, Resist stripper,
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#0 (0%) - sci-soft.com
Title: Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film mat
Description: Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also p
Keywords:Scientific Computing International, SCI, film thickness, thin film, thin film thickness, film thickness measurement, metrology, metrology tools, thin film metrology, thin film metrology tools, ellipsometry, ellipsometer, ellipsometers, spectroscopic ellipsometry, spectroscopic ellipsometer, SE, multiwavelength ellipsometer, reflectometry, reflectometer, reflectometers, spectroscopic reflectometry, spectroscopic reflectometer, multi angle reflectometer, material characterization, optical properties,
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#12,428,558 (-27%) - spektroninstruments.in
Title: Absorption Spectrophotometer,Spectroscopic Ellipsometer,Atomic Absorption Spectrophotometer
Description: Spektron Instruments Inc.,- Manufacturer and supplier of absorption spectrophotometer, atomic absorption spectrophotometer, microwave digestion system, spin coater, film thickness measuring system, spectroscopic ellipsometer, surface area analyser, mercu
Keywords:atomic absorption spectrophotometer, microwave digestion system, spin coater, film thickness measuring system, spectroscopic ellipsometer, surface area analyser, mercury porosimeters, desk top xrd, laser particle size analyzer, zeta potential analyzer, atomic absorption spectrophotometer manufacturer, microwave digestion system supplier, spin coater manufacturer, film thickness measuring system supplier, spectroscopic ellipsometer exporter, surface area analyser exporter, mercury porosimeters manufacturer, desk top xrd manufacturer, laser particle size analyzer exporter, zeta potential analyzer supplier, spektron-instruments, indiamart, india.
#176,557 (+45%) - kla-tencor.com
Title: Home | KLA-Tencor
Description: KLA-Tencor offers the industry's widest range of best-of-breed inspection and metrology tools -- combined with industry-leading process control expertise and best-practices know-how.
Keywords:KLA, Tencor, fab-wide, wafer, yield, management, copper, cops, damascene, defects, etch, laser confocal, laser confocal review, reticle inspection, semiconductor measurement, shrinks, spectroscopic ellipsometry, wafer defects, wafer inspection, Surface, Reticle, Mask, Inspection, Film, Measurement,
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